Decision Tree for Online Voltage Stability Margin Assessment Using C4.5 and Relief-F Algorithms

A Novel Index for Online Voltage Stability Assessment Based on Correlation Characteristic of Voltage Profiles

Abstract: Voltage instability is a major threat for security of power systems. Preserving voltage security margin at a certain limit is a vital requirement for today’s power systems. Assessment of voltage security margin is a challenging task demanding sophisticated indices. In this paper, for the purpose of on line voltage security assessment a new index based on the correlation characteristic...

Improving Voltage Stability Margin Using Voltage Profile and Sensitivity Analysis by Neural Network

This paper presents a new approach for estimating and improving voltage stability margin from phase and magnitude profile of bus voltages using sensitivity analysis of Voltage Stability Assessment Neural Network (VSANN). Bus voltage profile contains useful information about system stability margin including the effect of load-generation, line outage and reactive power compensation so, it is ad...

Assessment of ATC Using Voltage and Transient Stability, Simultaneously

Methods for calculating Available Transfer Capability (ATC) of the transmission systems may be grouped under Static and Dynamic methods. This paper presents a fast dynamic method for ATC calculations, which considers both Transient Stability Limits and Voltage Stability Limits as terminating criteria. A variation of Energy Function Method is used to determine the transient stability limit and t...

Assessment of ATC Using Voltage and Transient Stability, Simultaneously

Methods for calculating Available Transfer Capability (ATC) of the transmission systems may be grouped under Static and Dynamic methods. This paper presents a fast dynamic method for ATC calculations, which considers both Transient Stability Limits and Voltage Stability Limits as terminating criteria. A variation of Energy Function Method is used to determine the transient stability limit and t...

Voltage Security Margin Assessment